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Python implementation of Automatic Test Pattern Generation using the PODEM algorithm and SCOAP testability analysis, with four-valued fault logic, ISCAS-style benchmarks, and single stuck-at faults.

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ATPG, PODEM, and SCOAP Testability Analysis

Python 3.x Digital testability PODEM and SCOAP License MIT

Hardware test analysis project with Python

This repository contains a modular Python implementation of testability analysis for combinational digital circuits. It combines two coursework phases in one project:

  • Phase one: four-valued logic simulation and timing-aware propagation.
  • Phase two: SCOAP controllability/observability analysis and PODEM automatic test-pattern generation.

The project supports ISCAS-style netlists, single stuck-at faults, and benchmark circuits such as c1, c5, c17, c432, c6288, and c7552.

Project Workflow

The single entry point runs all analyses for the selected circuit through a Command Line Interface (CLI):

ISCAS netlist + input values + fault list
                    |
                    v
        Phase 1: true values and delay
                    |
                    v
        Phase 2: SCOAP and PODEM ATPG
                    |
                    v
                 output/

About

Python implementation of Automatic Test Pattern Generation using the PODEM algorithm and SCOAP testability analysis, with four-valued fault logic, ISCAS-style benchmarks, and single stuck-at faults.

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